Electronics Research Laboratory
Dept. of Microelectronics

MSc Hou

PhD student
Electronic Circuits and Architectures (ELCA), Department of Microelectronics

PhD thesis (Jan 2017): Non-intrusive Near-field Characterization of Microwave Circuits and Devices
Promotor: Leo de Vreede, Marco Spirito

Expertise: RF power transistors, RF characterization, Near field sensing

Themes: Microwave circuits, RF electronics

Publications

  1. Contactless Measurement of Absolute Voltage Waveforms by a Passive Electric-Field Probe
    Hou, Rui; Spirito, Marco; Van Rijs, Fred; de Vreede, Leo C. N.;
    IEEE Microwave and Wireless Components Letters,
    Volume 26, Issue 12, pp. 1008-1010, 2016. DOI: 10.1109/LMWC.2016.2623250
    Keywords: ... Circuit testing;Nonlinear network analysis;Calibration;Capacitance;Voltage measurement;Microstrip;Microwave measurement;Calibration;electric-field probe;microwave circuit testing;nonlinear vector network analyzer (NVNA).

  2. Nonintrusive Near-Field Characterization of Spatially Distributed Effects in Large-Periphery High-Power GaN HEMTs
    Hou, Rui; Lorenzini, Martino; Spirito, Marco; Roedle, Thomas; van Rijs, Fred; de Vreede, Leo C. N.;
    IEEE Transactions on Microwave Theory and Techniques,
    Volume 64, Issue 11, pp. 4048-4062, 2016. DOI: 10.1109/TMTT.2016.2613525
    Keywords: ... Gallium nitride;HEMTs;MODFETs;Load modeling;Power measurement;Logic gates;Device characterization;gallium nitride (GaN);high electron-mobility transistor (HEMT);near-field measurement.

  3. Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors
    Hou, Rui; Spirito, Marco; Heeres, Rob; van Rijs, Fred; de Vreede, Leo C.N.;
    In 2015 IEEE MTT-S International Microwave Symposium,
    pp. 1-3, 2015. DOI: 10.1109/MWSYM.2015.7166945
    Keywords: ... Radio frequency;Indexes;Modems;Performance evaluation;Distributed effects;LDMOS;near-field measurement;power amplifiers.

  4. A package-integratable six-port reflectometer for power devices
    Venter, Razvan G.; Rui Hou; Buisman, Koen; Spirito, Marco; Werner, Klaus; de Vreede, Leo C.N.;
    In 2014 IEEE MTT-S International Microwave Symposium (IMS2014),
    pp. 1-4, 2014. DOI: 10.1109/MWSYM.2014.6848549
    Keywords: ... Pollution measurement;Monitoring;Load modeling;Frequency measurement;Microwave measurement;Abstracts;Layout;Bondwire;directional coupler;package integration;power amplifier;reflection coefficient measurement;six-port reflectometer.

  5. Non-intrusive characterization of active device interactions in high-efficiency power amplifiers
    Hou, Rui; Spirito, Marco; Gajadharsing, John; de Vreede, Leo C.N.;
    In 2013 IEEE MTT-S International Microwave Symposium Digest (MTT),
    pp. 1-3, 2013. DOI: 10.1109/MWSYM.2013.6697599
    Keywords: ... Current measurement;Probes;Ports (Computers);Power amplifiers;Semiconductor device measurement;Power generation;Voltage measurement;Active load modulation;near-field measurement;RF power amplifiers.

  6. Contactless measurement of in-circuit reflection coefficients
    Rui Hou; Spirito, Marco; Kooij, Bert-Jan; van Rijs, Fred; de Vreede, Leo C.N.;
    In 2012 IEEE/MTT-S International Microwave Symposium Digest,
    pp. 1-3, 2012. DOI: 10.1109/MWSYM.2012.6259588

BibTeX support

Last updated: 26 Dec 2018

Rui Hou

Alumnus
  • Left in 2017