Machine Learning Calibrated ADC (ML-ADC)

High performance Analog-to-Digital Converters (ADCs) are tedious to design, as these building blocks are sensitive to many circuit level impairments. Due to years of research in this domains, the power efficiency of these converters has been improved with orders of magnitude. However, improving performance of these converters has become more and more difficult because fundamental limits are approached.

This project aims to develop machine learning algorithms that can calibrate ADCs that are optimized for noise only, and all impairments are calibrated by the machine learning algorithms. Also, it will investigate what are the implementation cost of these algorithms, and how to balance performance and implementation cost.

Project data

Researchers: Chang Gao
Starting date: November 2024
Closing date: October 2028
Funding: 681 kE; related to group 681 kE
Sponsor: NXP Semiconductors
Contact: Chang Gao