ir. F Mubarak

1. A Rigorous Analysis of the Random Noise in Reflection Coefficients Synthesized via Mixed-Signal Active Tuners
   Mubarak, Faisal; Munoz, Fabio; Spirito, Marco;
   In 2023 101st ARFTG Microwave Measurement Conference (ARFTG),
   pp. 1-4, 2023. DOI: 10.1109/ARFTG57476.2023.10279048
   
   Keywords: ...

   Additive noise;Tuners;Baseband;Uncertainty;Impedance measurement;Transfer functions;Reflection coefficient;S-parameter noise;frequency domain noise;residual-error;noise analysis;uncertainty analysis;vector network analyzer (VNA).

2. Impedance Standard Substrate Characterization and EM model definition for Cryogenic and Quantum-Computing Applications
   Shokrolahzade, Ehsan; Sebastiano, Fabio; Mubarak, Faisal; Babaie, Masoud; Spirito, Marco;
   In 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
   pp. 557-560, 2023. DOI: 10.1109/IMS37964.2023.10188097
   
   Keywords: ...

   Temperature measurement;Kelvin;Cryogenics;Microwave devices;Transformers;Load management;Calibration.

3. A Novel Calibration Method for Active Interferometer-Based VNAs
   Mubarak, F. A.; Romano, R.; Rietveld, G.; Spirito, M.;
   IEEE Microwave and Wireless Components Letters,
   Volume 30, Issue 8, pp. 829-832, 2020. DOI: 10.1109/LMWC.2020.3006701
   
   Keywords: ...

   Calibration;Interferometers;Measurement uncertainty;Impedance measurement;Impedance;Q measurement;Radio frequency;Calibration;extreme impedance measurement;impedance mismatch;measurement;microwave interferometry;nanoelectronics;nanostructures;noise;traceability;vector network analyzer (VNA).

4. Automated Contacting of On-Wafer Devices for RF Testing
   Mubarak, F.; Martino, C. D.; Toskovic, R.; Rietveld, G.; Spirito, M.;
   In 2020 Conference on Precision Electromagnetic Measurements (CPEM),
   pp. 1-2, 2020. DOI: 10.1109/CPEM49742.2020.9191800
   
   Keywords: ...

   Probes;Frequency measurement;Substrates;Measurement uncertainty;Coplanar waveguides;Correlation;Software measurement;On-wafer probing;on-wafer contacting;microwave measurements;measurement techniques;measurement uncertainty;precision measurements;uncertainty.

5. Noise Behavior and Implementation of Interferometer-Based Broadband VNA
   Mubarak, Faisal Ali; Romano, Rafaelle; Galatro, Luca; Mascolo, Vincenzo; Rietveld, Gert; Spirito, Marco;
   IEEE Transactions on Microwave Theory and Techniques,
   Volume 67, Issue 1, pp. 249-260, 2019. DOI: 10.1109/TMTT.2018.2874667
   
   Keywords: ...

   Noise measurement;Impedance measurement;Frequency measurement;Impedance;Broadband communication;Radio frequency;Sensitivity;Extreme impedance measurement;impedance mismatch;microwave interferometry;nanoelectronics;nanostructures;noise;vector network analyzer (VNA).

6. The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances
   Romano, Raffaele; Mubarak, Faisal; Spirito, Marco; Galatro, Luca;
   In 2019 93rd ARFTG Microwave Measurement Conference (ARFTG),
   pp. 1-6, 2019. DOI: 10.1109/ARFTG.2019.8739232
   
   Keywords: ...

   Calibration;Impedance;Impedance measurement;Sensitivity;Reflection coefficient;Standards;Mixers;vector network analyzer;extreme impedance;interferometer;IQ mixer;high gamma.

7. Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards
   Mubarak, F.; Mascolo, V.; Rietveld, G.; Spirito, M.; Daffe, K.; Haddadi, K.;
   In 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018),
   pp. 1-2, 2018. DOI: 10.1109/CPEM.2018.8500810
   
   Keywords: ...

   Uncertainty;Calibration;Coplanar waveguides;Standards;Frequency measurement;Measurement uncertainty;Probes;nanostructures;co-planar waveguide;on-wafer calibration;EM simulation;VNA;measurement uncertainty;precision measurements;traceability.

8. On the definition of reference planes in probe-level calibrations
   Galatro, Luca; Mubarak, Faisal; Spirito, Marco;
   In 2016 87th ARFTG Microwave Measurement Conference (ARFTG),
   pp. 1-4, 2016. DOI: 10.1109/ARFTG.2016.7501968
   
   Keywords: ...

   Calibration;Probes;Standards;Data models;Substrates;Solid modeling;Measurement uncertainty;VNA;calibration;on-wafer;EM simulation;wafer probes;RSOL.

9. Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
   Spirito, M.; Galatro, L.; Lorito, G.; Zoumpoulidis, T.; Mubarak, F.;
   In 2015 86th ARFTG Microwave Measurement Conference,
   pp. 1-5, 2015. DOI: 10.1109/ARFTG.2015.7381473
   
   Keywords: ...

   Standards;Calibration;Load modeling;Computational modeling;Integrated circuit modeling;Data models;Probes;VNA;calibration;on-wafer;EM simulation;fused silica.

10. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
    Mubarak, Faisal; Romano, Raffaele; Spirito, Marco;
    In 2015 86th ARFTG Microwave Measurement Conference,
    pp. 1-3, 2015. DOI: 10.1109/ARFTG.2015.7381475
    
    Keywords: ...

    Impedance measurement;Impedance;Calibration;Electrical resistance measurement;Instruments;Couplers;Reflection;Extreme impedance;S-parameter;VNA;interferometric principle;active compensation;SMM.

11. A method for de-embedding cable flexure errors in S-parameter measurements
    Mubarak, Faisal; Rietveld, Gert; Spirito, Marco;
    In 83rd ARFTG Microwave Measurement Conference,
    pp. 1-5, 2014. DOI: 10.1109/ARFTG.2014.6899529
    
    Keywords: ...

    Calibration;Measurement uncertainty;Standards;Scattering parameters;Impedance;Semiconductor device measurement;Impedance measurement;S-parameters;cable errors;VNA;PNA;cable flexure;impedance;de-embedding;measurement techniques;RF.

12. Characterizing cable flexure effects in S-parameter measurements
    Mubarak, Faisal; Rietveld, Gert; Hoogenboom, Dennis; Spirito, Marco;
    In 82nd ARFTG Microwave Measurement Conference,
    pp. 1-7, 2013. DOI: 10.1109/ARFTG-2.2013.6737336
    
    Keywords: ...

    Coaxial cables;Measurement uncertainty;Noise;Calibration;Vectors;Scattering parameters;Monte Carlo methods;VNA;PNA;S-parameters;cable effects;cable flexure;impedance;de-embedding;measurement;measurement techniques.

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