Characterization and modelling up to sub THz

Sub-mm-wave frequency circuits are very compact in size due to the wavelength reduction at increased frequency (e.g., a /4 coplanar transmission line integrated on silicon dioxide reduces from ~1.6 mm at 30GHz to ~160 um at 300GHz) and therefore have very small parasitic components. Consequently, small inaccuracies in the exact location of reference planes or deviations due to the systematic errors of the measurement setup can significantly impact the modeling of the device under test (DUT). Moreover the circuit performance at sub-mm-wave is pushing the limits of the technology, leaving no headroom or design margins. For this reason, the transistor models need to be accurately verified and their parameters properly adjusted to represent the sub-mm-wave behavior of the fabricated devices including electrothermal effects, large-signal and distortion behavior, non-quasi-static effects, and correlated noise. This requires on-wafer measurement capability that spans from DC to the mm-wave and sub-mm-wave frequency ranges. Consequently, there is a great need for reliable measurements of passive devices and high-speed transistors intended for sub-mm-wave frequencies at this moment.

Projects under this theme

Microwave measurements for planar circuits and components

PlanarCal aims to aim of the project is to enable traceable measurement of integrated planar circuits and components from radio-frequency (RF) to sub-mm frequencies.

Integrated Near Field sensOrs for high Resolution MicrowavE spectRoscopy

The goal of this project is the creation of a new class of sensors, enabling fast and accurate dielectric characterization of biological samples, with high-sensitivity and high-spatial resolution.

Non-Galvanic Contactless Connectors for Power and Data Transfer

The WiCon project will provide low-cost, highly-integrated system solutions for galvanic connectors replacement in the consumer and industrial market segments.


STW Take-off phase1: High gamma vector network analysis

HΓ-VNA targets the implementation of a new measurement technique, enabling accurate characterization of electronic devices as well as biological and organic materials, which share the common characteristic of presenting extreme loading condition in the RF/Microwave frequency range.

Metrology for optical and RF communication systems

To develop traceable methods for RF power and MIMO antenna measurements and cost-effective metrological solutions for smart, adaptive, reconfigurable and wearable antennas.

From RF to MMW and THz silicon SoC technologies

Silicon technology platforms for emerging RF, millimetre-wave and THz consumer applications.