ir. F Mubarak

1. A Novel Calibration Method for Active Interferometer-Based VNAs
   Mubarak, F. A.; Romano, R.; Rietveld, G.; Spirito, M.;
   IEEE Microwave and Wireless Components Letters,
   Volume 30, Issue 8, pp. 829-832, 2020. DOI: 10.1109/LMWC.2020.3006701

2. Automated Contacting of On-Wafer Devices for RF Testing
   Mubarak, F.; Martino, C. D.; Toskovic, R.; Rietveld, G.; Spirito, M.;
   In 2020 Conference on Precision Electromagnetic Measurements (CPEM),
   pp. 1-2, 2020. DOI: 10.1109/CPEM49742.2020.9191800

3. Noise Behavior and Implementation of Interferometer-Based Broadband VNA
   Mubarak, Faisal Ali; Romano, Rafaelle; Galatro, Luca; Mascolo, Vincenzo; Rietveld, Gert; Spirito, Marco;
   IEEE Transactions on Microwave Theory and Techniques,
   Volume 67, Issue 1, pp. 249-260, 2019. DOI: 10.1109/TMTT.2018.2874667

4. The HΓ-VNA, an Interferometric Approach for the Accurate Measurement of Extreme Impedances
   Romano, Raffaele; Mubarak, Faisal; Spirito, Marco; Galatro, Luca;
   In 2019 93rd ARFTG Microwave Measurement Conference (ARFTG),
   pp. 1-6, 2019. DOI: 10.1109/ARFTG.2019.8739232

5. On the definition of reference planes in probe-level calibrations
   L. Galatro; F. Mubarak; M. Spirito;
   In 2016 87th ARFTG Microwave Measurement Conference (ARFTG),
   pp. 1-4, May 2016.

6. Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
   M. Spirito; L. Galatro; G. Lorito; T. Zoumpoulidis; F. Mubarak;
   In 2015 86th ARFTG Microwave Measurement Conference,
   pp. 1-5, Dec 2015.

7. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
   F. Mubarak; R. Romano; M. Spirito;
   In 2015 86th ARFTG Microwave Measurement Conference,
   pp. 1-3, Dec 2015.

8. A method for de-embedding cable flexure errors in S-parameter measurements
   F. Mubarak; G. Rietveld; M. Spirito;
   In 83rd ARFTG Microwave Measurement Conference,
   pp. 1-5, June 2014.

9. Characterizing cable flexure effects in S-parameter measurements
   F. Mubarak; G. Rietveld; D. Hoogenboom; M. Spirito;
   In 82nd ARFTG Microwave Measurement Conference,
   pp. 1-7, Nov 2013.

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